Details
The Maury/NMDG Large-Signal Network Analyzer (LSNA) is the latest advancement in large-signal network analysis. It was developed by NMDG Engineering and Maury Microwave, using technology licensed to Maury by Agilent Technologies (patents pending). It combines a unique set of hardware and software tools that calibrate and measure non-linear component characteristics, with mathematical tools for describing and interpreting non-linear behavior. The LSNA is, at present, the only commercially available solution that provides for accurate and complete measurement of two-port DUT characteristics in large-signal environments where non-linear component behavior may occur.
Applications
* Transistor reliability/Repeatability
* Breakdown Current
* Forward Gate Conductance
* Transistor model qualification under realistic large-signal conditions
* Transistor model improvement using realistic large-signal measurements
* Application of PA design theory through waveform engineering
* Resistive Mixer Studies
* System-level studies using simple-to-complex signals with a single connection
Benefits
* Comprehensive understanding of complete large-signal DUT behavior under realistic RF or µwave excitation
* Reduced manufacturing costs by minimizing design cycles
* Optimize model parameters to LSNA measurements
* Benchmark a wide range of device models (e.g., BSIM, MM11, EKV, VBIC, MEXTRAM, HICUM, etc.)
* Higher confidence in your model versus small-signal modeling techniques
System Concept
The LSNA is designed to measure incident and scattered traveling voltage waves (or voltages and currents) in time, frequency domain or time-frequency domain (related to envelope simulation), as they appear at both signal ports of any two-port DUT under-going periodically modulated excitation. This is done while taking into account the possible interactions of what might be less-than-ideal qualities of the instrument in relation to the signal environment. This information represents the complete large-signal (non-linear) behavior of a device. The LSNA is a unique tool that measures the relevant spectral components of a two-port DUT under periodic, realistic RF or microwave excitation, and displays the resulting data as, a) Physical Quantity Sets (i.e., V-I and A, B) and b) Representation Domains (i.e., frequency (ƒ), time(t), and envelope). The measured data can be linked into other tools like ADS and ICCCAP using the supported CITIFile format.
Wednesday, November 12, 2008
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